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Authors

Meehan, Alan and O'Sullivan, Paula and Hurley, Paul and Mathewson, Alan

Year

1994

Month

January

Journal

Microelectronics Journal

Title

Evaluation of hot-carrier degradation of n-channel MOSFETs at low gate bias

Status

Validated

Peer Reviewed

Optional Fields

Keywords

Volume

25

Issue

7

Start Page

463

End Page

467

Abstract

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Editors

Publisher

ISBN / ISSN

Edition

URL

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