Mandatory Fields

Authors

Dimitriadis, C and Papadas, C and Conncanon, A and Villani, N and Vincent, E and Mathewson, A

Conference Title

Solid-State Device Research Conference, 1997. Proceeding of the 27th European

Title of Paper

A Stress Technique Suitable For The In-line Reliability Monitoring Of The Hot Carrier Endurance Of Sub-0.5 um MOSFETs

Year

1997

Month

January

Status

Validated

Peer Reviewed

Times Cited

()

Optional Fields

Keywords

Editors

Start Page

588

End Page

591

Location

Start Date

End Date

Abstract

Funded By

URL

DOI Link

Grant Details

Funding Body

Grant Details