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Mandatory Fields

Authors

Martin, A and Duane, R and O'Sullivan, P and Mathewson, A

Year

1998

Month

January

Journal

Microelectronics Reliability

Title

Dependence of gate oxide breakdown on initial charge trapping under Fowler-Nordheim injection

Status

Validated

Peer Reviewed

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Keywords

Volume

38

Issue

6

Start Page

1091

End Page

1096

Abstract

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Publisher

ISBN / ISSN

Edition

URL

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