Book Chapter Details

Mandatory Fields

Authors

Carlos, Sean and Foley, Sean and Mathewson, Alan and Rohan, James F

Year / Month

2001 January

Book Title

Publication Title

Stress Modelling of Multi Level Interconnect Schemes For Future Deep Submicron Device Generations

Publisher

Springer

Publisher Location

Status

Validated

Peer Reviewed

Optional Fields

Keywords

Abstract

Editors

ISBN / ISSN

URL

Start Page

364

End Page

367

DOI Link

Grant Details

Funding Body

Grant Details