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Authors

Martin, Andreas and O'Sullivan, Paula and Mathewson, Alan

Year

1997

Month

January

Journal

Microelectronics Reliability

Title

Correlation of SiO2 lifetimes from constant and ramped voltage measurements.

Status

Validated

Peer Reviewed

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Keywords

Volume

37

Issue

8

Start Page

1279

End Page

1279

Abstract

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Publisher

ISBN / ISSN

Edition

URL

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