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Authors

Tao, Jing and Mathewson, Alan and Razeeb, Kafil M

Conference Title

Microelectronic Test Structures (ICMTS), 2014 International Conference on

Title of Paper

Test structure for electrical characterization of copper nanowire anisotropic conductive film (NW-ACF) for 3D stacking applications

Year

2014

Month

January

Status

Validated

Peer Reviewed

Times Cited

()

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Keywords

Editors

Start Page

165

End Page

169

Location

Start Date

End Date

Abstract

Funded By

URL

DOI Link

Grant Details

Funding Body

Grant Details