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Authors

Olszewski, Z and Houlihan, R and Ryan, C and O’Mahony, C and Duane, R

Year

2012

Month

January

Journal

Applied Physics Letters

Title

Experimental isolation of degradation mechanisms in capacitive microelectromechanical switches

Status

Validated

Peer Reviewed

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Keywords

Volume

100

Issue

23

Start Page

233505

End Page

Abstract

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Edition

URL

DOI Link

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