More Journal Details

Mandatory Fields

Authors

OSullivan, BJ and Hurley, PK and Leveugle, C and Das, JH

Year

2001

Month

January

Journal

Journal of Applied Physics

Title

Si (100)--SiO 2 interface properties following rapid thermal processing

Status

Validated

Peer Reviewed

Optional Fields

Keywords

Volume

89

Issue

7

Start Page

3811

End Page

3820

Abstract

Publisher Location

Editors

Publisher

ISBN / ISSN

Edition

URL

DOI Link

Grant Details

Funding Body

Grant Details