Mandatory Fields

Contributor (s)

Mircea Modreanu (group member)

Conference Title

6th International workshop " Advanced ellipsometry, spectrophotometry and X-ray techniques for nanostructured material characterization

Short Description

Optical characterisation of materials

Location

Bucharest, Romania

Contribution Type

Oral Presentation

Year

2014

Times Cited

()

Peer Reviewed

Optional Fields

Start Date

10-SEP-14

End Date

12-SEP-14

Abstract

Funded By

SFI PI Grant and EU Grant Nano RF (FP7)