Conference Contribution Details
Mandatory Fields
Mircea Modreanu (group member)
6th International workshop " Advanced ellipsometry, spectrophotometry and X-ray techniques for nanostructured material characterization
Optical characterisation of materials
Bucharest, Romania
Oral Presentation
2014
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0
Optional Fields
10-SEP-14
12-SEP-14
SFI PI Grant and EU Grant Nano RF (FP7)