Peer-Reviewed Journal Details

Mandatory Fields

Authors

Ernst, Thomas and Cristoloveanu, Sorin and Vandooren, Anne and Rudenko, Tamara and Colinge, J

Year

1999

Month

January

Journal

Title

Recombination current modeling and carrier lifetime extraction in dual-gate fully-depleted SOI devices

Status

Validated

Times Cited

()

Optional Fields

Keywords

Volume

46

Issue

7

Start Page

1503

End Page

1509

Abstract

Publisher Location

ISBN / ISSN

Edition

URL

DOI Link

Grant Details

Funding Body

Grant Details