Peer-Reviewed Journal Details
Mandatory Fields
Lee, Chi-Woo and Lederer, Dimitri and Afzalian, Aryan and Yan, Ran and Dehdashti, Nima and Xiong, Weize and Colinge, Jean-Pierre
2008
January
Comparison of contact resistance between accumulation-mode and inversion-mode multigate FETs
Validated
()
Optional Fields
52
11
1815
1820
Grant Details