Mandatory Fields

Authors

Schulz, T and Xiong, W and Cleavelin, CR and Schruefer, K and Gostkowski, M and Matthews, K and Gebara, G and Zaman, RJ and Patruno, P and Chaudhry, A and others

Conference Title

SOI Conference, 2005. Proceedings. 2005 IEEE International

Title of Paper

Fin thickness asymmetry effects in multiple-gate SOI FETs (MuGFETs)

Year

2005

Month

January

Status

Validated

Peer Reviewed

Times Cited

()

Optional Fields

Keywords

Editors

Start Page

154

End Page

156

Location

Start Date

End Date

Abstract

Funded By

URL

DOI Link

Grant Details

Funding Body

Grant Details