Peer-Reviewed Journal Details

Mandatory Fields

Authors

Lee, Jae-Ki and Choi, Nag-Jong and Hyun, Yun-Bong and Yu, Chong-Gun and Colinge, J and Park, Jong-Tae

Year

2002

Month

January

Journal

Title

Hot carrier-induced SOI MOSFET degradation under AC stress conditions

Status

Validated

Times Cited

()

Optional Fields

Keywords

Volume

23

Issue

3

Start Page

157

End Page

159

Abstract

Publisher Location

ISBN / ISSN

Edition

URL

DOI Link

Grant Details

Funding Body

Grant Details