Peer-Reviewed Journal Details

Mandatory Fields

Authors

Gentinne, B and Flandre, Denis and Colinge, J-P

Year

1996

Month

January

Journal

Title

Measurement and modeling of thin-film accumulation-mode SOI< i> p-MOSFET intrinsic gate capacitances

Status

Validated

Times Cited

()

Optional Fields

Keywords

Volume

39

Issue

7

Start Page

1071

End Page

1078

Abstract

Publisher Location

ISBN / ISSN

Edition

URL

DOI Link

Grant Details

Funding Body

Grant Details