Peer-Reviewed Journal Details

Mandatory Fields

Authors

Nazarov, AN and Barchuk, IP and Lysenko, VS and Colinge, JP

Year

1999

Month

January

Journal

Title

„Parameter extraction for buried oxide trap from high-temperature kinkeffect of back-channel SOI n-MOSFET”

Status

Validated

Times Cited

()

Optional Fields

Keywords

Volume

3

Issue

Start Page

299

End Page

304

Abstract

Publisher Location

ISBN / ISSN

Edition

URL

DOI Link

Grant Details

Funding Body

Grant Details