Peer-Reviewed Journal Details

Mandatory Fields

Authors

Tae Park, Jong and Jong Choi, Nag and Gun Yu, Chong and Hee Jeon, Seok and Colinge, Jean-Pierre

Year

2003

Month

January

Journal

Title

Increased hot carrier effects in Gate-All-Around SOI nMOSFET’s

Status

Validated

Times Cited

()

Optional Fields

Keywords

Volume

43

Issue

9-11

Start Page

1427

End Page

1432

Abstract

Publisher Location

ISBN / ISSN

Edition

URL

DOI Link

Grant Details

Funding Body

Grant Details