Mandatory Fields

Authors

Raskin, Jean-Pierre and Gillon, Renaud and Vanhoenacker, D and Colinge, Jean-Pierre

Conference Title

Microelectronic Test Structures, 1996. ICMTS 1996. Proceedings. 1996 IEEE International Conference on

Title of Paper

Direct extraction method of SOI MOSFET transistors parameters

Year

1996

Month

January

Status

Validated

Peer Reviewed

Times Cited

()

Optional Fields

Keywords

Editors

Start Page

191

End Page

194

Location

Start Date

End Date

Abstract

Funded By

URL

DOI Link

Grant Details

Funding Body

Grant Details