Conference Publication Details
Mandatory Fields
Lee, C-W and Ferain, Isabelle and Afzalian, Aryan and Byun, K-Y and Yan, Ran and Dehdashti, Nima and Razavi, P and Xiong, Weize and Colinge, Jean-Pierre and Colinge, CA and others
Solid State Device Research Conference, 2009. ESSDERC'09. Proceedings of the European
Hot carrier (HC) and bias-temperature-instability (BTI) degradation of MuGFETs on silicon oxide and silicon nitride buried layers
2009
January
Validated
()
Optional Fields
261
264
Grant Details