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Authors

Yan, Ran and Afzalian, Aryan and Lee, Chi-Woo and Dehdashti Akhavan, Nima and Xiong, Weize and Colinge, Jean-Pierre and others

Conference Title

2008 China-Ireland International Conference on Information and Communication Technologies (CIICT 2008)

Title of Paper

3D simulation and measurement of very narrow AM and IM triple-gate MOSFETs

Year

2008

Month

January

Status

Validated

Peer Reviewed

Times Cited

()

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Abstract

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