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Authors

Xiong, Weize and Hsu, CH and Cleavelin, CR and Ma, M and Patruno, P and Lee, Chi-Woo and Yan, Ran and Lederer, Dimitri and Afzalian, Aryan and Colinge, Jean-Pierre and others

Conference Title

2007 IEEE International SOI Conference

Title of Paper

Influence of Fluorine Implant on Threshold Voltage for Metal Gate FDSOI and MuGFET

Year

2007

Month

January

Status

Validated

Peer Reviewed

Times Cited

()

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Abstract

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