Ernst, T and Cristoloveanu, S and Vandooren, A and Rudenko, T and Colinge, JP

1999

January

SPECIAL SECTION ON 1998 EUROPEAN SOLID-STATE DEVICE RESEARCH CONFERENCE-SPECIAL SECTION PAPERS-Recombination Current Modeling and Carrier Lifetime Extraction in Dual-Gate Fully-Depleted SOI

Validated

()

46

7

1503

1509