Dambrine, G and Raskin, JP and Danneville, F and Vanhoenacker-Janvier, D and Colinge, JP and Cappy, A

1999

January

PAPERS-Solid-State Device Phenomena-High-Frequency Four Noise Parameters' of Silicon-on-Insulator-Based Technology MOSFET for the Design of Low-Noise RF Integrated Circuits

Validated

()

46

8

1733

1741