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Authors

MacSweeney, D,McCarthy, KG,Floyd, L,Riordan, M,Sattler, L,Mathewson, A,Power, JA,Kelly, SC,IEEE,IEEE

Conference Title

A novel approach to the estimation of confidence limits for BJT model sets using a bootstrap technique

Title of Paper

ICMTS 2001: PROCEEDINGS OF THE 2001 INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES

Year

2001

Month

January

Status

Validated

Peer Reviewed

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()

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Keywords

BIPOLAR-TRANSISTORS

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Abstract

In this paper, a novel method for the estimation of confidence intervals of extracted parameter values is proposed. The technique is based on a Bootstrap method which evaluates the error distributions which are associated with parameter extraction techniques. Using this technique, a confidence interval can then be estimated for extracted parameter values. Results are presented for DC, capacitance and high frequency measurements.

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