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Authors

Liang, WZ,van Langevelde, R,McCarthy, KG,Mathewson, A,IEEE,IEEE

Conference Title

Efficient parameter extraction techniques for a new surface-potential-based MOS model for RF applications

Title of Paper

ICMTS 2001: PROCEEDINGS OF THE 2001 INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES

Year

2001

Month

January

Status

Validated

Peer Reviewed

Times Cited

()

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Editors

Start Page

141

End Page

145

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End Date

Abstract

Efficient parameter extraction techniques for a new surface-potential-based MOS model are outlined. The new model is suitable for RF CMOS design because it has improved modelling of surface potential, mobility and conductance. The extraction techniques are based on analytical manipulation of the model equations and allow parameters to be extracted using as few as 12 measurements per device.

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