Peer-Reviewed Journal Details

Mandatory Fields

Authors

Welten, M.; Clancy, R.; Power, J. A.; Mason, B.; Stribley, P.; Mathewson, A.;

Year

0

Month

Journal

Iee Colloquium (Digest)

Title

Statistical Worst-Case Simulation for CMOS Technology [B2745]

Status

Published

Times Cited

()

Optional Fields

Keywords

Volume

0.153

Issue

Start Page

4

End Page

01/04/03

Abstract

Publisher Location

ISBN / ISSN

Edition

URL

DOI Link

Grant Details

Funding Body

Grant Details