Peer-Reviewed Journal Details

Mandatory Fields

Authors

Healy, S.; McCarthy, K.; Mason, B.; Mathewson, A.;

Year

0

Month

Journal

Iee Colloquium (Digest)

Title

Temperature Characterisation and Parameter Extraction for Fine-Geometry CMOS Processes [B2747]

Status

Published

Times Cited

()

Optional Fields

Keywords

Volume

0.033

Issue

Start Page

13

End Page

01/13/07

Abstract

Publisher Location

ISBN / ISSN

Edition

URL

DOI Link

Grant Details

Funding Body

Grant Details