Peer-Reviewed Journal Details
Mandatory Fields
MacSweeney,D.; McCarthy,K.G.; Floyd,L.; Duane,R.; Hurley, P.; Power, J.A.; Kelly, S.C.; Mathewson, A.;
2003
May
IEEE Transactions on Semiconductor Manufacturing
Improving the Accuracy and Efficiency of Junction Capacitance Characterization: Strategies for Probing Configuration and Data Set Size
Published
()
Optional Fields
16
2
207
214
Grant Details