Peer-Reviewed Journal Details

Mandatory Fields

Authors

Hurley, P. K.; Sheehan, E.; Moran, S.; Mathewson, A.;

Year

1996

Month

Unknown

Journal

Microelectronics and Reliability

Title

Impact of Oxide Degradation on the Low Frequency (1/f) Noise Behaviour of p Channel MO'SFETs [B2671]

Status

Published

Times Cited

()

Optional Fields

Keywords

Volume

36.11/12

Issue

Start Page

1679

End Page

1682

Abstract

Publisher Location

ISBN / ISSN

Edition

URL

DOI Link

Grant Details

Funding Body

Grant Details