Mandatory Fields

Contributor (s)

Meehan, A.; Minehane, S.; Clancy, R.; O'Sullivan, P.; Mathewson, A.;

Conference Title

Proceedings of the 6th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF'95)

Short Description

Location

Hot Carrier Reliability Simulation Of MOS Circuits Using A Direct SPICE Parameter Extraction Strateg

Contribution Type

N/A

Year

2003

Times Cited

()

Peer Reviewed

Optional Fields

Start Date

01-JAN-03

End Date

30-DEC-99

Abstract

Funded By