Mandatory Fields

Contributor (s)

Martin, A.; O'Sullivan, P.; Mathewson, A.;

Conference Title

Proceedings of the 6th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF '95) (3-6 October)

Short Description

Location

Reliability Measurements With Ramped and Constant Voltage Stress on MOS Gate Oxides [B2737]

Contribution Type

N/A

Year

2003

Times Cited

()

Peer Reviewed

Optional Fields

Start Date

01-JAN-03

End Date

30-DEC-99

Abstract

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