Mandatory Fields

Contributor (s)

Foley, S.; Ryan, A.; Martin, D.; Mathewson, A.;

Conference Title

Proceedings of the International Symposium on the Physical &Failure Analysis of Integrated Circuits, IPFA

Short Description

Location

Study of the Influence of Inter-Metal Dielectrics on Electromigration Performance [B2741]

Contribution Type

N/A

Year

2003

Times Cited

()

Peer Reviewed

Optional Fields

Start Date

01-JAN-03

End Date

30-DEC-99

Abstract

Funded By