Mandatory Fields

Contributor (s)

Martin, A.; Suehle, J.; Chaparala, P.; O'Sullivan, P.; Mathewson, A.; Messick, C.;

Conference Title

IEEE International Integrated Reliability Workshop Final Report

Short Description

Location

Assessing MOS Gate Oxide Reliability on Wafer Level With Ramped/Constant Voltage and Current Stress

Contribution Type

N/A

Year

2003

Times Cited

()

Peer Reviewed

Optional Fields

Start Date

01-JAN-03

End Date

30-DEC-99

Abstract

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