Conference Contribution Details

Mandatory Fields

Contributor (s)

Lovett, S. J.; Clancy, R.; Welten, M.; Mathewson, A.; Mason, B.;

Conference Title

IEEE International Conference on Microelectronic Test Structures

Short Description

*

Location

Characterizing the Mismatch of Submicron MOS Transistors [B2755]

Contribution Type

N/A

Year

2003

Times Cited

()

Peer Reviewed

Optional Fields

Start Date

01-JAN-03

End Date

30-DEC-99

Abstract

Funded By

*