Mandatory Fields

Contributor (s)

Martin, A.; Suehle, J. S.; Chaparala, P.; O'Sullivan, P.; Mathewson, A.;

Conference Title

Annual Proceedings - IEEE Reliability Physics (Symposium) (IRPS)

Short Description

Location

New Oxide Degradation Mechanism for Stresses in the Fowler-Nordheim Tunneling Regime [B2756]

Contribution Type

N/A

Year

2003

Times Cited

()

Peer Reviewed

Optional Fields

Start Date

01-JAN-03

End Date

30-DEC-99

Abstract

Funded By