Mandatory Fields

Contributor (s)

A. Zanchi, F. Zappa, M. Ghioni, A. Giudice, A. P. Morrison and V. S. Sinnis;

Conference Title

IEEE International Caracas Conference on Devices, Circuits and Systems (ICCDCS 2000)

Short Description

Probe Detectors for Mapping Manufacturing Defects

Location

Cancun, Mexico

Contribution Type

Oral Presentation

Year

2000

Times Cited

()

Peer Reviewed

Optional Fields

Start Date

15-MAR-00

End Date

17-MAR-00

Abstract

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