McCarthy, K.G.; Saavedra Diaz,E.V.; Klaassen,D.B.M.; Mathewson,A.;

International Conference on Microelectronic Test Structures (ICMTS 1998)

Statistical Characterization and Analysis of 0.18um Low-Power CMOS Process using Efficient Parameter Extraction

1998

March

Published

1

()

Koyama,H,; Asada,K.

127

131

Kanazawa, Japan

23-MAR-98

26-MAR-98

Research Grant