Mandatory Fields

Authors

Minehane,S.; Healy,S.; O'Sullivan,P.; McCarthy,K.; Mathewson,A.; Mason,B.;

Conference Title

6th International Symposium on the Physics and Failure Analysis of Integrated Circuits (IPFA 1997)

Title of Paper

Direct BSIM3v3 Parameter Extraction for Hot Carrier Reliability Simulation of n-Channel LDD MOSFETs

Year

1997

Month

July

Status

Published

Peer Reviewed

Times Cited

()

Optional Fields

Keywords

Editors

Start Page

133

End Page

139

Location

Singapore

Start Date

21-JUL-97

End Date

25-JUL-97

Abstract

Funded By

N/A

URL

DOI Link

Grant Details

Funding Body

Grant Details