Conference Publication Details
Mandatory Fields
O'Sullivan,J.A.;McCarthy,K.G.;Murphy,A.C.;Murphy,P.J.;
IEEE International Conference on Microelectronic Test Structures (ICMTS)
Verification of Layout Efficient Shield-Based De-Embedding Techniques for On-Wafer HBT Characterization up to 30GHz
2005
April
Published
1
()
Optional Fields
Schaper,U.;Sansen,W.
119
124
Leuven, Belgium
04-APR-05
07-APR-05
Enterprise Ireland
Grant Details