Mandatory Fields

Authors

O'Sullivan,J.A.;McCarthy,K.G.;Murphy,P.J.;

Conference Title

IEEE International Conference on Microelectronic Test Structures (ICMTS)

Title of Paper

Characterisation of Advanced Multilayer De-embedding Structures up to 50GHz Incorporating a Novel Validation Standard

Year

2006

Month

March

Status

Published

Peer Reviewed

Times Cited

()

Optional Fields

Keywords

Editors

Start Page

End Page

Location

Austin, USA

Start Date

06-MAR-06

End Date

09-MAR-06

Abstract

Funded By

Enterprise Ireland

URL

DOI Link

Grant Details

Funding Body

Grant Details