Peer-Reviewed Journal Details
Mandatory Fields
Ansari, L;Feldman, B;Fagas, G;Colinge, JP;Greer, JC
2010
August
Applied Physics Letters
Simulation of junctionless Si nanowire transistors with 3 nm gate length
Validated
WOS: 84 ()
Optional Fields
97
Inspired by recent experimental realizations and theoretical simulations of thin silicon nanowire-based devices, we perform proof-of-concept simulations of junctionless gated Si nanowire transistors. Based on first-principles, our primary predictions are that Si-based transistors are physically possible without major changes in design philosophy at scales of similar to 1 nm wire diameter and similar to 3 nm gate length, and that the junctionless transistor avoids potentially serious difficulties affecting junctioned channels at these length scales. We also present investigations into atomic-level design factors such as dopant positioning and concentration. (C) 2010 American Institute of Physics. [doi:10.1063/1.3478012]
MELVILLE
0003-6951
10.1063/1.3478012
Grant Details