Peer-Reviewed Journal Details
Mandatory Fields
O'Brien, P,O'Callaghan, J,McInerney, J;
1998
January
Electronic Letters
Internal temperature distribution measurements in high power semiconductor lasers
Validated
()
Optional Fields
34
1399
1401
A novel technique to measure internal temperature distributions within high power semiconductor lasers with substrates transparent to the laser radiation is presented. The temperature resolution is better than 1 degrees C with a spatial resolution of 1-2 mu m. The results show highly non-uniform transverse temperature distributions and significant heating close to the facet at high output powers.
Grant Details