Peer-Reviewed Journal Details
Mandatory Fields
Cao, YM;Robson, AJ;Alharbi, A;Roberts, J;Woodhead, CS;Noori, YJ;Bernardo-Gavito, R;Shahrjerdi, D;Roedig, U;Fal'ko, VI;Young, RJ
2017
December
2d Materials
Optical identification using imperfections in 2D materials
Validated
Optional Fields
TRANSITION-METAL DICHALCOGENIDES SINGLE-LAYER MOS2 QUANTUM CONFINEMENT GRAIN-BOUNDARIES MONOLAYER SEMICONDUCTOR GROWTH DEPOSITION RESISTANCE DISULFIDE
4
The ability to uniquely identify an object or device is important for authentication. Imperfections, locked into structures during fabrication, can be used to provide a fingerprint that is challenging to reproduce. In this paper, we propose a simple optical technique to read unique information from nanometer-scale defects in 2D materials. Imperfections created during crystal growth or fabrication lead to spatial variations in the bandgap of 2D materials that can be characterized through photoluminescence measurements. We show a simple setup involving an angleadjustable transmission filter, simple optics and a CCD camera can capture spatially-dependent photoluminescence to produce complex maps of unique information from 2D monolayers. Atomic force microscopy is used to verify the origin of the optical signature measured, demonstrating that it results from nanometer-scale imperfections. This solution to optical identification with 2D materials could be employed as a robust security measure to prevent counterfeiting.
BRISTOL
2053-1583
10.1088/2053-1583/aa8b4d
Grant Details