Peer-Reviewed Journal Details
Mandatory Fields
Kachkanov V.;Dolbnya I.;O'Donnell K.;Lorenz K.;Pereira S.;Watson I.;Sadler T.;Li H.;Zubialevich V.;Parbrook P.
2013
March
Physica Status Solidi C - Current Topics In Solid State Physics
Characterisation of III-nitride materials by synchrotron X-ray microdiffraction reciprocal space mapping
Validated
Scopus: 2 ()
Optional Fields
Nitride materials Reciprocal space mapping Synchrotron radiation X-ray microdiffraction
10
3
481
485
X-ray Reciprocal Space Mapping (RSM) is a powerful tool to explore the structure of semiconductor materials. However, conventional lab-based RSMs are usually measured in two dimensions (2D) ignoring the third dimension of diffraction-space volume. We report the use of a combination of X-ray microfocusing and state-of-the-art 2D area detectors to study the full volume of diffraction-space while probing III-nitride materials on the microscale. 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
1862-6351
10.1002/pssc.201200596
Grant Details