Peer-Reviewed Journal Details
Mandatory Fields
TRAGERCOWAN, C and PARBROOK, PJ and YANG, F and CHEN, X and HENDERSON, B and ODONNELL, KP and COCKAYNE, B and WRIGHT, PJ;
1992
Journal of Crystal Growth
ELECTRON-BEAM EXCITATION AND PROFILING OF STRAINED CDS EPILAYERS GROWN BY METALORGANIC VAPOR-PHASE EPITAXY ON GAAS(111)A, GAAS(100), ZNSE(100) AND ZNS(100) SUBSTRATES
Validated
()
Optional Fields
117
1-4
532
535
The variation in the penetration depth of an electron beam with energy is used to profile the strain in various CdS epilayers. The red shift of the excitonic luminescence with increasing beam energy is consistent with an increase of compressive strain with depth.
Grant Details