Conference Contribution Details
Mandatory Fields
C Trager-Cowan, F Sweeney, P R Edwards, A J Wilkinson, R W Martin, P Trimby, N-H Schmidt, P J Parbrook and D Zubia;
3rd International Workshop on Nitride Semiconductors
Characterisation of nitride thin films by the combination of electron backscatter diffraction, X-ray diffraction and cathodoluminescence
Pittsburgh, USA
2004
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Optional Fields
18-JUL-04
23-JUL-04