Conference Publication Details

Mandatory Fields

Authors

Chen, W; McCarthy, KG; Copuroglu, M; O'Brien, S; Winfield, R; Mathewson, A;

Conference Title

IEEE International Conference on Microelectronic Test Structures

Title of Paper

Electrical Characterization of Novel PMNT Thin-films

Year

2010

Month

March

Status

Validated

Peer Reviewed

1

Times Cited

()

Optional Fields

Keywords

Editors

Start Page

98

End Page

101

Location

Hiroshima

Start Date

22-MAR-10

End Date

25-MAR-10

Abstract

Funded By

URL

DOI Link

Grant Details

Funding Body

Grant Details