Conference Publication Details
Mandatory Fields
Chen, W., McCarthy, K.G., Mathewson, A.;
IEEE International Conference on Microelectronic Test Structures
Practical Considerations for Measurement of Test Structures for Dielectric Characterization
2009
April
Validated
1
()
Optional Fields
221
225
Oxnard
30-MAR-09
02-APR-09
Grant Details