Modreanu, M, Nolan, M, Elliott, SD, Durand, O, Servet, B, Garry, G, Gehan, H, Huyberechts, G, Papadopoulou, EL, Androulidaki, M, Aperathitis, E;

2007

July

Thin Solid Films

Optical and Microstructural Properties of P-Type Srcu2o2: First Principles Modeling and Experimental Studies

Validated

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515

24

8624

8631

In this paper, we report first principles calculations and experimental studies of the optical and microstructural properties of both bulk and thin films of SrCu2O2. Polycrystalline SrCu2O2 films were grown by a conventional Pulsed Laser Deposition method in a flowing oxygen environment on coming glass 7059 and silicon substrates. Several characterization techniques, including X-ray diffraction (XRD), Fourier Transform IR (FTIR), Raman, spectroscopic ellipsometry, reflectance/transmission spectrophotometry and Atomic Force Microscopy have been used for the investigation of the microstructural and vibrational properties of both bulk and thin films of SrCu2O2.. XRD shows that bulk SrCu2O2 is polycrystalline and assumes the pure tetragonal phase of SrCuO2. The vibrational properties of the tetragonal phase of SrCu2O2 have been inferred from Raman and FTIR spectroscopies and for the first time both Raman and IR active modes have been assigned. The bulk polycrystalline SrCu2O2 optical band gap determined from spectroscopic ellipsometry was 3.34 +/- 0.01 eV XRD results confirmed that pure non-textured polycrystalline phase SrCu2O2 thin films with a smooth surface can be grown by PLD at low temperature (300 degrees C). (c) 2007 Elsevier B.V. All rights reserved..

DOI 10.1016/j.tsf.2007.03.103