Other

O'Sullivan, JA, McCarthy, KG, Murphy, PJ;

2006

June

Characterisation of Advanced Multilayer De-Embedding Structures Up to 50 Ghz Incorporating A Novel Validation Standard

Validated

1

()

Modern multi-level metallisation schemes offer the possibility of many innovative structures for frequency characterisation and de-embedding. In this paper we perform a detailed charaterisation of several such structures up to 50 GHz and show their application to measurements of a high performance HBT device. We further propose a consistency check, by comparing independent DC and s-parameter measurements, to gain further confidence in the de-embedding operations..

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